网络彩票APP下载_澳客彩票网-官方游戏

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?-VIS: Multidisciplinary, Multiscale, Microtomographic Volume Imaging

Nikon/Xtek 160 kVp Benchtop

- Training and hands-on experience-

Nikon/X-Tek 160 kVp Benchtop
Nikon/X-Tek 160 kVp Benchtop

Centre’s first XCT scanner. Bought back in 2009 and now mainly used for training (MSc, PhD students) and demonstration purposes. Is equipped with a 160 kVp X-Ray reflection source (Mo and W target), capable of maintaining a spot size ≥ 3 ?m. Its 1248x1248 pixels flat panel detector allows for imaging of samples up to 90 mm diameter.

In a nutshell:

? 30 -160 kVp
? reflection source, ~3?m spot size limit
? 1248x1248 flat panel detector
? samples to ~90mm diameter, 5kg

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