网络彩票APP下载_澳客彩票网-官方游戏

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The University of 网络彩票APP下载_澳客彩票网-官方游戏,
?-VIS: Multidisciplinary, Multiscale, Microtomographic Volume Imaging

Modified 225 kVp Nikon/Xtek HMX

- All-purpose X-Ray CT and Radiographic inspection system -

Modified Nikon/Xtek HMX (225 kVp)
Modified Nikon/Xtek HMX (225 kVp)

This is a custom Nikon XTEK XTH 225 kVp micro-focus CT system equipped with a robotic sample exchanger (~ 150 mm height limit). It is perfect for relatively small specimens (< 300 mm in height) that can be scanned using a 225 kVp X-Ray source. The source can be configured for high resolution or high flux through a range of different anodes; namely a transmission anode (spot ≥ 1 ?m, low flux), a standard multi-material reflection anode (spot ≥ 3 ?m, 'normal' flux) and a rotating anode (spot ?≥ 10?m, x3 -5 flux). A labyrinth at the rear of the system allows routing of cables and pipes that can control and feed in-situ rigs for time-resolved (4D) ?-CT experiments.

In a nutshell:

? three configurations
? transmission (~1?m spot limit, low flux)
? standard reflection (~3?m spot, 'normal' flux)
? rotating target (~10?m spot limit, x3-5 flux)
? 2 x 2k flat panel detector
? samples to ~300mm and 50kg
? robotic sample exchange (~150mm height limit)

Modified Nikon/Xtek HMX (225 kVp)
Modified Nikon/Xtek HMX (225 kVp)
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